International Journal of Innovative Research in Computer Science and Technology - IJIRCST Journal

Volume: 12, Issue: 3, 2024

Pages : 113 - 119

Enhancing Laboratory Experience: A Combination of RFID and Machine Learning Techniques to Track Attendance and Upgrade Hardware

Prasanna Kumar M, Likhith K Raj, Karthik M, Chandu Shivaputrappa Barker, Manoj R